JJ X-ray Products
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Spectrum Analyzer
The Spectrum Analyzer is used to measure the wavelength spectrum from single shots of the x-ray beam. This is achieved by diffracting a small portion of beam intensity through a grating. The diffracted beam from the grating passes through a curved single crystal. The curvature of the crystal will generate a dispersive beam distributing the wavelength band over an angular interval. The distributed radiation is collected by a Gotthard detector to an adjustable 2-theta scattering angle.
Design Features:
- Custom curved single crystal material and size (e.g., Si 111, Ge 110)
- Water-cooled crystal
Categories:
Technical Specifications
Crystal Position Range (Beam path at Z-axis)
Crystal theta rotation: 65 degrees
X-axis (crystal in and out): 165 mm (4 crystals at 40 mm gap)
Y-axis (vertical): +/- 3 mm
Detector Positioning
X-axis: +/- 50 mm
2-theta rotation: 130 degrees
Overall Dimensions
Length (X-axis): 1000 mm
Width (Z-axis, along the beam): 650 mm
Height (2-theta arm at 90 deg): 1500 mm (2-theta arm = 1 m radius)
