JJ X-Ray offers a range of cutting-edge products designed to enhance the precision and reliability of X-ray analysis systems. Diagnostic and analytic tools are essential for accurately measuring and analyzing X-ray beams, ensuring optimal performance across a variety of applications. Whether (you’re working with) (it is about) beam positioning, energy dispersion, or reflectometry, our products provide the necessary diagnostics to fine-tune your X-ray systems.

The BIU-Beam Imaging Unit and XBPM – X-ray Beam Position Monitor are essential for real-time beam monitoring and precise positioning, allowing users to ensure the accuracy of X-ray delivery. For more detailed spectroscopic analysis, our Johann-type Spectrometer, Von Hamos Spectrometer, and Von Hamos for 16 Crystals offer high-resolution energy dispersions, making them ideal for material characterization. Meanwhile, our Gridded Ion Chamber ensures accurate dose measurements and is a critical tool for assessing the intensity and quality of X-ray radiation. Additionally, the Soft X-ray Reflectometer allows for precise surface and thin-film analysis, delivering critical insights for materials research.

These diagnostics and analytics tools are designed for scenarios(or projects) that require high-precision measurements and comprehensive analysis in X-ray environments. With a commitment to performance and reliability, our solutions are built to support your most advanced X-ray diagnostics needs.